Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6818197 | Epitaxial wafer | Kazuhiro Ikezawa, Ken Nakajima, Tamiya Karashima | 2004-11-16 |
| 6693286 | Method for evaluating the quality of a semiconductor substrate | Takeshi Hasegawa, Terumi Ito | 2004-02-17 |