Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6787375 | Microelectronic fabrication die electrical test method providing enhanced microelectronic fabrication die electrical test efficiency | Yao-Tung Liu, Chun-Tsung Yang, Juei-Feng Hsu | 2004-09-07 |
| 6724211 | System for validating and monitoring semiconductor testing tools | Shun-An Chen, Li-Chung Lin, Yao-Tung Liu, Ming-Hui Lin, Hsin-Hom Chen +1 more | 2004-04-20 |