Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6737199 | Using new pattern fracturing rules for optical proximity correction mask-making to improve critical dimension uniformity | — | 2004-05-18 |
RH
Ren-Guey Hsieh
Overall (2004): #132,791 of 270,089Top 50%
1
Patents 2004