Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6784681 | Semiconductor integrated circuit testing system and method | Keiichi Fujimoto | 2004-08-31 |
| 6781400 | Method of testing semiconductor integrated circuits and testing board for use therein | Shinichi Oki | 2004-08-24 |