Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6753971 | Method for determining geometric structures on or in a substrate as well as material parameters | — | 2004-06-22 |
| 6744521 | Method for determining the thickness of a multi-thin-layer structure | Wolfgang Schaudig, Wilbert Windeln | 2004-06-01 |