Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6774655 | Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit | Yasurou Matsuzaki, Masao Nakano, Toshiya Uchida, Atsushi Hatakeyama, Yasuhiro Fujii | 2004-08-10 |
| 6771108 | Input circuit and semiconductor integrated circuit having the input circuit | Yasuharu Sato, Yasurou Matsuzaki, Takaaki Suzuki | 2004-08-03 |