KS

Keiichi Sawai

Sharp Kabushiki Kaisha: 1 patents #278 of 1,015Top 30%
📍 Fukuyama, JP: #9 of 44 inventorsTop 25%
Overall (2004): #176,640 of 270,089Top 70%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6717263 Semiconductor device having contact opening smaller than test probe, and manufacturing process and inspecting method thereof Osamu Jinushi 2004-04-06