TM

Tatsuya Miyatani

SI Seiko Instruments: 2 patents #39 of 192Top 25%
Overall (2004): #39,147 of 270,089Top 15%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6740876 Scanning probe microscope Akira Egawa, Kunio Nakajima 2004-05-25
6710339 Scanning probe microscope Akira Egawa 2004-03-23