SS

Shoji Sadayama

SI Seiko Instruments: 2 patents #39 of 192Top 25%
Overall (2004): #41,312 of 270,089Top 20%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6685847 Method for observing cross-sectional structure of sample 2004-02-03
6686600 TEM sample slicing process 2004-02-03