HK

Hyun Sik Kim

Samsung: 1 patents #906 of 2,858Top 35%
📍 Daejeon, ID: #1 of 1 inventorsTop 100%
Overall (2004): #61,122 of 270,089Top 25%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6778927 System and method of obtaining measuring characteristic correction factors for respiratory flow measuring device using static pressure difference Un Jong Cha, Kyoung-ae Kim 2004-08-17
6779181 Micro-scheduling method and operating system kernel Hang Yu 2004-08-17