Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822914 | Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory device | Chang Sik Kim, Hyun Dong Kim, Young-Uk Chang, Seok-Won Hwang | 2004-11-23 |