Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815237 | Testing apparatus and method for determining an etch bias associated with a semiconductor-processing step | James Chingwei Li, Berinder Brar | 2004-11-09 |
| 6800531 | Method of fabricating a bipolar transistor | James Chingwei Li, Berinder Brar, John A. Higgins | 2004-10-05 |
| 6797995 | Heterojunction bipolar transistor with InGaAs contact and etch stop layer for InP sub-collector | James Chingwei Li, Berinder Brar, John A. Higgins | 2004-09-28 |