Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6823042 | Apparatus for X-ray analysis and apparatus for supplying X-rays | Seiichi Hayashi, Sadayuki Takahashi, Masaru Kuribayashi | 2004-11-23 |
| 6813338 | Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector | Masaki Takata, Eiji Nishibori, Makoto Sakata | 2004-11-02 |