Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6802034 | Test pattern generation circuit and method for use with self-diagnostic circuit | Yukikazu Matsuo | 2004-10-05 |
| 6784686 | Semiconductor testing device | Hiroki Nishida | 2004-08-31 |