Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6784684 | Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals | — | 2004-08-31 |
| 6774657 | Apparatus and method of inspecting semiconductor integrated circuit | Osamu Hashimoto | 2004-08-10 |
| 6750672 | Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same | Mitsuhiro Hamada, Osamu Hashimoto | 2004-06-15 |