KS

Kazuhiro Sakaguchi

NE Nec: 3 patents #34 of 1,039Top 4%
NE Nec Electronics: 1 patents #49 of 338Top 15%
Overall (2004): #14,165 of 270,089Top 6%
4
Patents 2004

Issued Patents 2004

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6766485 Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program 2004-07-20
6704675 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 2004-03-09
6694274 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 2004-02-17
6684170 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 2004-01-27