Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6812729 | System and method for characterizing the quality of the interface between a silicon and a gate insulator in a MOS device | Miin-Jang Chen, Ching-Fuh Lin, Chee-Wee Liu, Min-Hung Lee | 2004-11-02 |