Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6801321 | Method and apparatus for measuring lateral variations in thickness or refractive index of a transparent film on a substrate | — | 2004-10-05 |
| 6762838 | Method and apparatus for production line screening | — | 2004-07-13 |
| 6678055 | Method and apparatus for measuring stress in semiconductor wafers | Yaron Ish-Shalom | 2004-01-13 |