JP

Jaime Poris

NI Nanometrics Incorporated: 5 patents #1 of 11Top 10%
📍 Portola Valley, CA: #7 of 80 inventorsTop 9%
🗺 California: #878 of 28,370 inventorsTop 4%
Overall (2004): #8,967 of 270,089Top 4%
5
Patents 2004

Issued Patents 2004

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
6813031 Method of determining material using intensity of light Claudio L. Rampoldi 2004-11-02
6772620 Method of generating calibration data for relative height measurement 2004-08-10
6762846 Substrate surface profile and stress measurement 2004-07-13
6710888 Method of measuring dishing 2004-03-23
6700670 Method of measuring dishing using relative height measurements 2004-03-02