Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815958 | Method and apparatus for measuring thickness of thin films with improved accuracy | Boris Kesil, Leonid Velikov | 2004-11-09 |
| 6801044 | Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects | Boris Kesil, Leonid Velikov | 2004-10-05 |