Issued Patents 2004
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6817602 | Manufacturing system method for processing a lithography mask container | Alain Charles, John Maltabes | 2004-11-16 |
| 6801322 | Method and apparatus for IN SITU measuring a required feature of a layer during a polishing process | — | 2004-10-05 |
| 6759248 | Semiconductor wafer identification | Jason Zeakes | 2004-07-06 |
| 6744494 | Continuously adjustable neutral density area filter | John Maltabes, Alain Charles | 2004-06-01 |
| 6737205 | Arrangement and method for transferring a pattern from a mask to a wafer | John Maltabes, Alain Charles | 2004-05-18 |
| 6709312 | Method and apparatus for monitoring a polishing condition of a surface of a wafer in a polishing process | — | 2004-03-23 |
| 6686254 | Semiconductor structure and method for reducing charge damage | Joseph Petrucci, John Maltabes, Alain Charles | 2004-02-03 |