Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794890 | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested | Yasushi Tokumo, Shigeki Maekawa, Shigeru Takada | 2004-09-21 |
| 6741086 | Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus | Shigeki Maekawa, Megumi Takemoto | 2004-05-25 |