Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6714888 | Apparatus for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2004-03-30 |
| 6690189 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2004-02-10 |