Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6819580 | Semiconductor chip selectively providing a predetermined potential to a dead pin | Masayuki Konishi | 2004-11-16 |
| 6789174 | Memory access device allowing simultaneous access | Masayuki Konishi | 2004-09-07 |
| 6711708 | Boundary-scan test method and device | — | 2004-03-23 |
| 6674153 | Semiconductor device utilizing pad to pad wire interconnection for improving detection of failed region on the device | Katsuyoshi Watanabe | 2004-01-06 |