Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6810106 | X-ray fluorescence thickness measurement device | — | 2004-10-26 |
| 6798863 | Combined x-ray analysis apparatus | — | 2004-09-28 |
| 6681707 | Sewing machine having a means for setting a sewing working device to a predetermined optimum set value | Kanji Michioku | 2004-01-27 |