Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6745484 | Reticle, and pattern positional accuracy measurement device and method | Tsutomu Horie | 2004-06-08 |
| 6708323 | Method and apparatus for verifying mask pattern data according to given rules | Tsutomu Horie | 2004-03-16 |