Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6724212 | Method for testing a semiconductor integrated circuit | Kazuo Aoki | 2004-04-20 |
| 6674300 | Method for testing a semiconductor integrated circuit when a difference between two consecutive current exceeds a threshold value | Kazuo Aoki | 2004-01-06 |