Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6819132 | Method to prevent damage to probe card | — | 2004-11-16 |
| 6819161 | Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing | Paul Sharratt | 2004-11-16 |
| 6809378 | Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing | Paul Sharratt | 2004-10-26 |
| 6762608 | Apparatus and method for testing fuses | Tim Damon | 2004-07-13 |
| 6760871 | Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test | — | 2004-07-06 |