Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6757209 | Memory cell structural test | Tak M. Mak, Michael J. Tripp | 2004-06-29 |
| 6721216 | Memory addressing structural test | Tak M. Mak, Michael J. Tripp | 2004-04-13 |
| 6717428 | Method and apparatus for detecting defects in a circuit using spectral analysis of transient power supply voltage | — | 2004-04-06 |