Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6756805 | System for testing integrated circuit devices | Joseph C. Sher, Huy T. Vo, Nicholas M. van Heel, Victor Wong, Hua Zheng | 2004-06-29 |
| 6735132 | 6F2 DRAM array with apparatus for stress testing an isolation gate and method | — | 2004-05-11 |