YL

Yen-Ting Lu

MC Macronix International Co.: 1 patents #71 of 215Top 35%
Overall (2004): #84,260 of 270,089Top 35%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6753117 Method for reducing line edge roughness of patterned photoresist — 2004-06-22