Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6775630 | Web-based interface with defect database to view and update failure events | Nima A. Behkami, James W. Seale, Mark A. Giewont, Robert Powell | 2004-08-10 |
| 6770505 | Arrangement for measuring pressure on a semiconductor wafer and an associated method for fabricating a semiconductor wafer | — | 2004-08-03 |
| 6716364 | Method and apparatus for detecting presence of residual polishing slurry subsequent to polishing of a semiconductor wafer | Gregory Burns, Theodore Moore | 2004-04-06 |