Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6768542 | Defect inspecting device for substrate to be processed and method of manufacturing semiconductor device | Hirotoshi Ise, Toshiki Oono, Toshio Komemura, Masato Toyota, Toshihiko Noguchi | 2004-07-27 |
| 6747337 | Semiconductor wafer with a dicing line overlapping a defect | Hidekazu Yamamoto | 2004-06-08 |