FH

Fumio Hosokawa

JE Jeol: 2 patents #3 of 50Top 6%
Overall (2004): #65,026 of 270,089Top 25%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6836373 Spherical aberration corrector for electron microscope 2004-12-28
6744048 Lens system for phase plate for transmission electron microscope and transmission electron microscope Kuniaki Nagayama, Radostin Stoyanov Danev 2004-06-01