Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6781205 | Electrostatic charge measurement on semiconductor wafers | Alexander Ignatenko | 2004-08-24 |
| 6719142 | Apparatus and method for measuring static charge on wafers, disks, substrates, masks, and flat panel displays | John Edgar Menear | 2004-04-13 |