Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6759255 | Method and system for detecting metal contamination on a semiconductor wafer | Zhiwei Xu, Arun Ramaswamy SRIVATSA, Amin Samsavar, Greg Horner, Steven M. Weinzierl | 2004-07-06 |
| 6734696 | Non-contact hysteresis measurements of insulating films | Gregory S. Horner | 2004-05-11 |