SD

S. Gabriel R. Dosdos

AM AMD: 1 patents #442 of 1,035Top 45%
📍 San Jose, CA: #938 of 2,805 inventorsTop 35%
🗺 California: #8,555 of 28,370 inventorsTop 35%
Overall (2004): #122,200 of 270,089Top 50%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6768329 Structure and method of testing failed or returned die to determine failure location and type Joel J. Orona, Daniel C. Nuez 2004-07-27