MA

Mohamed Kamel Amara

📍 Dover, DE: #6 of 14 inventorsTop 45%
🗺 Delaware: #167 of 579 inventorsTop 30%
Overall (2004): #149,547 of 270,089Top 60%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6731380 Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films Noureddine Melikechi, Sabbir M. Mian 2004-05-04