Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6826735 | Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device | Hisafumi Iwata, Kanako Harada | 2004-11-30 |
| 6775817 | Inspection system and semiconductor device manufacturing method | Hisafumi Iwata, Keiko Kirino | 2004-08-10 |
| 6747655 | Monitor system, display device and image display method | Tetsu Kubota | 2004-06-08 |
| 6687633 | Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices | Hisafumi Iwata | 2004-02-03 |