Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816570 | Multi-technique thin film analysis tool | Jeffrey Allen Moore | 2004-11-09 |
| 6786099 | Surface photo-acoustic film measurement device and technique | — | 2004-09-07 |
| 6788760 | Methods and apparatus for characterizing thin films | Roger Kroeze, Murali Narsimhan | 2004-09-07 |
| 6771735 | Method and apparatus for improved x-ray reflection measurement | Jeffrey Allen Moore | 2004-08-03 |
| 6711232 | X-ray reflectivity measurement | — | 2004-03-23 |