Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6813572 | Apparatus and methods for managing reliability of semiconductor devices | Akella V. S. Satya, Li Song, Robert Long | 2004-11-02 |
| 6795952 | System and method for product yield prediction using device and process neighborhood characterization vehicle | Brian E. Stine, David Stashower, Sherry Lee | 2004-09-21 |
| 6751519 | Methods and systems for predicting IC chip yield | Akella V. S. Satya, Li Song, Robert Long | 2004-06-15 |
| 6732002 | Apparatus and methods for predicting multiple product chip yields through critical area matching | Gaurav Verma | 2004-05-04 |