JM

Jean-Louis Massieu

II Intermec Ip: 3 patents #1 of 28Top 4%
📍 Montauban, FR: #1 of 7 inventorsTop 15%
Overall (2004): #27,146 of 270,089Top 15%
3
Patents 2004

Issued Patents 2004

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6776342 Process for the parameterization of scanners for one-dimensional or two-dimensional printed codes Serge Thuries 2004-08-17
6732930 Optoelectronic device and process for acquiring symbols, such as bar codes, using a two-dimensional sensor Jean-Michel Puech, Khalid Elakel 2004-05-11
6687403 Process and device for detection of straight-line segments in a stream of digital data that are representative of an image in which the contour points of said image are identified Khalid El Akel, Christophe Dumontier, Patrick Reuze, Serge Thuries, Jean-Michel Puech 2004-02-03