Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815977 | Scan cell systems and methods | Anil K. Sabbavarapu, Talal K. Jaber, Grant McFarland, Paven R. Sunkerneni | 2004-11-09 |
| 6795948 | Weighted random pattern test using pre-stored weights | Chih-Jen Lin | 2004-09-21 |
| 6683467 | Method and apparatus for providing rotational burn-in stress testing | Ali Keshavarzi, Yibin Ye, Vivek K. De | 2004-01-27 |