TB

Thorsten Bucksch

Infineon Technologies Ag: 2 patents #200 of 1,096Top 20%
Overall (2004): #38,273 of 270,089Top 15%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6754869 Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer Ralf Schneider 2004-06-22
6750670 Integrated test circuit Ralf Schneider 2004-06-15