Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836106 | Apparatus and method for testing semiconductors | Ronald G. Filippi, Kenneth P. Rodbell, Ping-Chuan Wang | 2004-12-28 |
| 6803662 | Low dielectric constant material reinforcement for improved electromigration reliability | Ping-Chuan Wang, Ronald G. Filippi | 2004-10-12 |