Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6792075 | Method and apparatus for thin film thickness mapping | Krzysztof Kozaczek, David S. Kurtz, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2004-09-14 |
| 6678347 | Method and apparatus for quantitative phase analysis of textured polycrystalline materials | Krzysztof Kozaczek, David S. Kurtz, Roger Isaac Martin | 2004-01-13 |