Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6825671 | Integrated electromigration length effect testing method and apparatus | — | 2004-11-30 |
| 6785416 | System and method for the processing of scanned image data using a pixel window | Shenbo Yu, Fred W. Andree, Steve Pratt | 2004-08-31 |
| 6772279 | Method and apparatus for monitoring the status of CAM comparand registers using a free list and a busy list | Chih-Ping Sun, Wen-Chau Wayne Hou | 2004-08-03 |