Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795185 | Film thickness measuring apparatus | Tomoya Yoshizawa | 2004-09-21 |
| 6714301 | Spectral ellipsometer without chromatic aberrations | Yutaka Saijo | 2004-03-30 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795185 | Film thickness measuring apparatus | Tomoya Yoshizawa | 2004-09-21 |
| 6714301 | Spectral ellipsometer without chromatic aberrations | Yutaka Saijo | 2004-03-30 |