Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6745618 | Scanning probe microscope | Yukari Imai, Mari Tsugami, Hitoshi Maeda | 2004-06-08 |
| 6677760 | Method of and apparatus for analyzing failure | — | 2004-01-13 |
| 6678623 | Failure analysis device and failure analysis method | — | 2004-01-13 |