Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6823485 | Semiconductor storage device and test system | — | 2004-11-23 |
| 6735726 | Method of deciding error rate and semiconductor integrated circuit device | Hideaki Kato, Yutaka Ito | 2004-05-11 |